Research on the Technique of X-ray Thickness GaugeAbstract:The application of SIEMENS PLC in thickness gauge of thin films is studied, and the merits and demerits of electric control systems based on industrial computer and PLC are compared. The composition and principle of the electric control system of the thickness gauge are introduced in detail, and the method of data processing is explained. The practice shows that the control system is simple, high efficient and reliable. The whole plant has been successfully used on production line of thin film of polypropylene.[著者文摘]