標題: X射線測量板材厚度系統研究 [打印本頁] 作者: 飄八零 時間: 2008-10-15 22:55 標題: X射線測量板材厚度系統研究 廖平 馬洪秋 陳峰
中南大學機電工程學院,湖南長沙410083
摘 要:傳統測厚系統中采用工控機或PLC，數據處理慢，人機交互性差。針對這些缺點，對AT mega 16單片機在板材測厚儀上的應用進行研究，并比較了傳統的以工控機為核心的電控系統與以AT mega 16單片機為電控核心的系統的優缺點。詳細介紹了測厚儀電控系統的組成和原理，同時對基于Delphi的測厚數據的處理方法進行了說明。實踐表明，該系統控制結構簡單，有較高的運行效率和可靠性。[著者文摘]
Research on technique of X-ray thickness gaugeLIAO Ping, MA Hong-qin,CHEN Feng College of Mechanical and Electronical Engineering, Central South University, Changsha 410083, ChinaAbstract:Conventional system of measuring thickness adopts industrial control computer or PLC, while its speed to process data is low and has poor human-machine interact capability. Aiming at these drawbacks, research on the application of AT mega 16 single chip on thickness gauge was conducted. Compare of the advantages and disadvantages of conventional electric control system taking industrial control computer as the kernel and system with AT mega 16 single chip as the electric control kernel was carried out. The composition and principle of electric control system of thickness gauge was introduced in details. Meantime, the measured thickness data process method based on Delphi was expounded. Practice indicates that control structure of this system is simple and it has high operating efficiency and reliability.[著者文摘]
Key words:X-Ray;system of measuring thickness;Delphi;AVR
