Uncertainty Analysis of Indirect Measuring System ModelsPAN Guang-bin, CHEN Guang-ju 1. College of Automatics, University of Electronic Science and Technology, Chengdu, Sichuan 610054, China; 2. Metrology and Testing Center, China Academy of Engineering Physics, Mianyang, Sichuan 621900, ChinaAbstract:According to the different features of indirect measuring system models such as the number or the type of variable, and the functional relations between system input and output, a method for evaluating various models uncertainty with the concern of some calibration and verification parameters of electron and mechanism is described. This can be used as an extends and complements to the contents of ISO GUM.[著者文摘]
