Nanotechnologies are developing rapidly, and associated documentary standards and regulations are being put in place at the national and international levels. There is increasing pressure on metrologists to develop reliable and accurate measurement techniques and methods to underpin these. To meet this expectation, international coordination among National Metrology Institutes (NMIs) is required, with new approaches to overcome the complexity of this area caused by its highly multidisciplinary nature. The BIPM is therefore organizing a Workshop on Metrology at the Nanoscale, which will take place at the BIPM on 18-19 February 2010.
This event is aimed at bringing together representatives from the NMIs with other stakeholders, such as nanomaterial manufacturers, regulatory authorities and standardization bodies involved in nanotechnologies, to answer the following question:What activities are required to establish an effective international infrastructure for metrology at the nanoscale?
Participation at this event is restricted to experts nominated by the Intergovernmental Organizations, International Organizations, and National Metrology Institutes.