標題: ASTM F 1260M-1996 集成電路金屬噴鍍總量和電遷移中值失效... [打印本頁] 作者: 兌水 時間: 2009-11-30 10:35 標題: ASTM F 1260M-1996 集成電路金屬噴鍍總量和電遷移中值失效... F1260M-96(2003) Standard Test Method for Estimating Electromigration Median Time-to-Failure and Sigma of Integrated Circuit Metallizations [Metric]