標題: ASTM F 1259M-1996 金屬電遷移造成的噴鍍開路或阻力增加失效... [打印本頁] 作者: 兌水 時間: 2009-11-30 10:34 標題: ASTM F 1259M-1996 金屬電遷移造成的噴鍍開路或阻力增加失效... F1259M-96(2003) Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric]