標題: ASTM F 980M-1996 測量硅半導體器件中中子感應位移故障的快速... [打印本頁] 作者: 兌水 時間: 2009-11-27 16:35 標題: ASTM F 980M-1996 測量硅半導體器件中中子感應位移故障的快速... F980M-96(2003) Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices [Metric]