標(biāo)題: ASTM F 76-1986 測(cè)量單晶半導(dǎo)體的電阻率、霍爾系數(shù)及霍爾遷... [打印本頁(yè)] 作者: 兌水 時(shí)間: 2009-11-18 10:16 標(biāo)題: ASTM F 76-1986 測(cè)量單晶半導(dǎo)體的電阻率、霍爾系數(shù)及霍爾遷... F76-86(2002) Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors