標題: ASTM F 76-1986 測量單晶半導體的電阻率、霍爾系數及霍爾遷... [打印本頁] 作者: 兌水 時間: 2009-11-18 10:16 標題: ASTM F 76-1986 測量單晶半導體的電阻率、霍爾系數及霍爾遷... F76-86(2002) Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors