標題: ASTM E 1250-1988 評估硅電子器件輻射強度試驗用鈷60輻射源... [打印本頁] 作者: 兌水 時間: 2009-11-5 10:04 標題: ASTM E 1250-1988 評估硅電子器件輻射強度試驗用鈷60輻射源... E1250-88(2000) Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices