標(biāo)題: ASTM E 1162-1987 二次離子質(zhì)譜法(SIMS)中報(bào)告濺射深度截面數(shù)據(jù) [打印本頁] 作者: 兌水 時(shí)間: 2009-11-4 21:22 標(biāo)題: ASTM E 1162-1987 二次離子質(zhì)譜法(SIMS)中報(bào)告濺射深度截面數(shù)據(jù) E1162-87(2001) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)