標(biāo)題: ASTM D 5796-2003 用鉆孔裝置進(jìn)行破壞法測試薄膜涂覆系統(tǒng)的干... [打印本頁] 作者: 兌水 時間: 2009-10-19 08:48 標(biāo)題: ASTM D 5796-2003 用鉆孔裝置進(jìn)行破壞法測試薄膜涂覆系統(tǒng)的干... D5796-03 Standard Test Method for Measurement of Dry Film Thickness of Thin Film Coil-Coated Systems by Destructive Means Using a Boring Device