標(biāo)題: ASTM B 588-1988用雙束干涉顯微技術(shù)測量透明涂層或不透明涂... [打印本頁] 作者: 兌水 時間: 2009-9-13 14:55 標(biāo)題: ASTM B 588-1988用雙束干涉顯微技術(shù)測量透明涂層或不透明涂... B588-88(2001) Standard Test Method for Measurement of Thickness of Transparent or Opaque Coatings by Double-Beam Interference Microscope Technique